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  Combined EELS, EDX, and STEM investigations of Cu-induced nanostrucutures and thin surface layer phases

Hollensteiner, S., Sigle, W., Spiecker, E., & Jäger, W. (2005). Combined EELS, EDX, and STEM investigations of Cu-induced nanostrucutures and thin surface layer phases. Zeitschrift für Metallkunde, 96, 888-893.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0010-283E-A Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0010-283F-8
Genre: Journal Article
Alternative Title : Z. Metallk.

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 Creators:
Hollensteiner, S1, Author
Sigle, W.2, 3, Author              
Spiecker, E.1, Author
Jäger, W.1, Author
Affiliations:
1Technische Fakultät, Christian-Albrechts-Universität zu Kiel, Kiel, Germany, ou_persistent22              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

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Free keywords: MPI für Metallforschung; Ehemalige Abt. Rühle;
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Language(s): eng - English
 Dates: 2005
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Method: Peer
 Identifiers: eDoc: 241934
 Degree: -

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Title: Zeitschrift für Metallkunde
  Alternative Title : Z. Metallk.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 96 Sequence Number: - Start / End Page: 888 - 893 Identifier: -