Interfacial free volumes and segregation effects in nanocrystalline Pd85Zr15 
studied by positron annihilation

Weigand, H.; Sprengel, W.; Rower, R.; Schaefer, H. E.; Wejrzanowski, T.; Kelsch, M.

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Interfacial free volumes and segregation effects in nanocrystalline Pd₈₅Zr₁₅ studied by positron annihilation

Weigand, H., Sprengel, W., Rower, R., Schaefer, H. E., Wejrzanowski, T., & Kelsch, M. (2004). Interfacial free volumes and segregation effects in nanocrystalline Pd₈₅Zr₁₅ studied by positron annihilation. Applied Physics Letters, 84(17), 3370-3372.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-294A-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-294B-6

Genre: Journal Article

Alternative Title : Appl. Phys. Lett.

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Creators:
Weigand, H.¹, Author
Sprengel, W.¹, Author
Rower, R.¹, Author
Schaefer, H. E.¹, Author
Wejrzanowski, T.¹, Author
Kelsch, M.^{2, 3}, Author

Affiliations:
1Univ Stuttgart, Inst Theoret & Appl Phys, D-70569 Stuttgart, Germany.; Warsaw Univ Technol, Fac Mat Sci & Engn, PL-02507 Warsaw, Poland.;, ou_persistent22
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669

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Free keywords: MPI für Metallforschung; Abt. Rühle; ZWE Hochspannungs-Mikroskopie;

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Language(s): eng - English

Dates: Date issued: 2004-04-26

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 211662
ISI: 000220958100050

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Title: Applied Physics Letters

Alternative Title : Appl. Phys. Lett.

Source Genre: Journal

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Pages: - Volume / Issue: 84 (17) Sequence Number: - Start / End Page: 3370 - 3372 Identifier: ISSN: 0003-6951