English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
 Local TagsRelease HistoryDetailsSummary
  Parameter Detection of Thin Films from their X-Ray Reflectivity by Support Vector Machines.

Strauß, D., Steidl, G., & Welzel, U. (2004). Parameter Detection of Thin Films from their X-Ray Reflectivity by Support Vector Machines. Applied Numerical Mathematics, 48, 223-236.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-29E0-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-29E1-0
Genre: Journal Article

Files

show Files
hide Files
:
349.pdf (Abstract), 10KB
 
File Permalink:
-
Name:
349.pdf
Description:
-
OA-Status:
Visibility:
Restricted (Max Planck Institute for Intelligent Systems, MSMT; )
MIME-Type / Checksum:
application/pdf
Technical Metadata:
Copyright Date:
-
Copyright Info:
eDoc_access: INSTITUT
License:
-

Locators

show

Creators

show
hide
 Creators:
Strauß, D.J., Author
Steidl, G., Author
Welzel, U.1, Author           
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              

Content

show
hide
Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
 Abstract: -

Details

show
hide
Language(s): eng - English
 Dates: 2004
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 124095
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Applied Numerical Mathematics
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 48 Sequence Number: - Start / End Page: 223 - 236 Identifier: -