Welzel, U. Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;
Strauß, D., Steidl, G., & Welzel, U. (2004). Parameter Detection of Thin Films from their X-Ray Reflectivity by Support Vector Machines. Applied Numerical Mathematics, 48, 223-236.
