Parameter Detection of Thin Films from their X-Ray Reflectivity by Support 
Vector Machines.

Strauß, D.J.; Steidl, G.; Welzel, U.

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Parameter Detection of Thin Films from their X-Ray Reflectivity by Support Vector Machines.

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Welzel, U.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Strauß, D., Steidl, G., & Welzel, U. (2004). Parameter Detection of Thin Films from their X-Ray Reflectivity by Support Vector Machines. Applied Numerical Mathematics, 48, 223-236.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-29E0-1

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