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  Progress in the preparation of cross-sectional TEM specimens by ion-beam thinning

Strecker, A., Bäder, U., Kelsch, M., Salzberger, U., Sycha, M., Gao, M., et al. (2003). Progress in the preparation of cross-sectional TEM specimens by ion-beam thinning. Zeitschrift für Metallkunde, 94, 290-297.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0010-2F39-F Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0010-2F3B-B
Genre: Journal Article

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 Creators:
Strecker, A.1, Author              
Bäder, U.1, Author              
Kelsch, M.1, Author              
Salzberger, U.1, Author              
Sycha, M.1, Author              
Gao, M.1, Author              
Richter, G.1, 2, Author              
van Benthem, K.1, Author              
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640              

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Free keywords: MPI für Metallforschung; Abt. Rühle; ZWE Hochspannungs-Mikroskopie;
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Language(s): eng - English
 Dates: 2003
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Method: Peer
 Identifiers: eDoc: 200435
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Title: Zeitschrift für Metallkunde
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 94 Sequence Number: - Start / End Page: 290 - 297 Identifier: -