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  EFTEM tomography on nanomaterials

Jin-Phillipp, N. Y., Koch, C. T., & van Aken, P. A. (2009). EFTEM tomography on nanomaterials. In G. Kothleitner, & M. Leisch (Eds.), MC2009. Vol. 1: Instrumentation and Methodology (pp. 73-74). Graz: Verlag der Technischen Universität Graz, Austria.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3E13-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3E14-A
Genre: Conference Paper

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 Creators:
Jin-Phillipp, N. Y.1, 2, 3, Author           
Koch, C. T.1, 3, Author           
van Aken, P. A.3, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645              
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

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Free keywords: MPI für Intelligente Systeme; Stuttgart Center for Electron Microscopy (StEM);
 Abstract: -

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Language(s): eng - English
 Dates: 2009
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 435823
DOI: 10.3217/978-3-85125-062-6-035
 Degree: -

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Title: MC2009, Microscopy Conference
Place of Event: Graz, Austria
Start-/End Date: 2009-08-30 - 2009-09-04

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Title: MC2009. Vol. 1: Instrumentation and Methodology
Source Genre: Proceedings
 Creator(s):
Kothleitner, G., Editor
Leisch, M., Editor
Affiliations:
-
Publ. Info: Graz : Verlag der Technischen Universität Graz, Austria
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 73 - 74 Identifier: -