Element-specific imaging of magnetic domains at 25 nm spatial Resolution using 
soft X-ray microscopy

Fischer, P.; Eimüller, T.; Schütz, G.; Denbeaux, G.; Pearson, A.; Johnson, L.; Attwood, D.; Tsunashima, S.; Kumazawa, M.; Takagi, N.; Köhler, M.; Bayreuther, G.

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Element-specific imaging of magnetic domains at 25 nm spatial Resolution using soft X-ray microscopy

Fischer, P., Eimüller, T., Schütz, G., Denbeaux, G., Pearson, A., Johnson, L., et al. (2001). Element-specific imaging of magnetic domains at 25 nm spatial Resolution using soft X-ray microscopy. Review of Scientific Instruments, 72, 2322-2324.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-49F4-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-49F5-6

Genre: Journal Article

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Creators:
Fischer, P.¹, Author
Eimüller, T.¹, Author
Schütz, G.¹, Author
Denbeaux, G., Author
Pearson, A., Author
Johnson, L., Author
Attwood, D., Author
Tsunashima, S., Author
Kumazawa, M., Author
Takagi, N., Author
Köhler, M., Author
Bayreuther, G., Author

Affiliations:
1Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497648

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Free keywords: MPI für Metallforschung; Abt. Schütz;

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Language(s): eng - English

Dates: Date issued: 2001

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 250776

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Title: Review of Scientific Instruments

Source Genre: Journal

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Pages: - Volume / Issue: 72 Sequence Number: - Start / End Page: 2322 - 2324 Identifier: -