Zhang, Z., Sigle, W., Koch, C. T., & Rühle, M. (2011). Dynamic behavior of nanometer-scale amorphous intergranular film in silicon nitride by in situ high-resolution transmission electron microscopy. Journal of the European Ceramic Society, 31(9), 1835-1840. doi:10.1016/j.jeurceramsoc.2011.03.016.