English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy

Knoll, B., & Keilmann, F. (2000). Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy. Optics Communications, 182(4-6), 321-328.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Knoll, B., Author
Keilmann, F.1, Author           
Affiliations:
1External Organizations, ou_persistent22              

Content

show
hide
Free keywords: Resolution; Microwave; Diode.; Applied Physics/Condensed Matter/Materials Science in Current Contents(R)/Physical, Chemical & Earth Sciences. Optics & Acoustics in Current Contents(R)/Engineering, Computing & Technology.
 Abstract: Ovid-processing week 38/00

Details

show
hide
Language(s):
 Dates: 2000
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 318309
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Optics Communications
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 182 (4-6) Sequence Number: - Start / End Page: 321 - 328 Identifier: -