Enhanced dielectric contrast in scattering-type scanning near-field optical 
microscopy

Knoll, B.; Keilmann, F.

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy

MPS-Authors

There are no MPG-Authors in the publication available

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Knoll, B., & Keilmann, F. (2000). Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy. Optics Communications, 182(4-6), 321-328.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-717F-A

Abstract

Ovid-processing week 38/00