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  EUV calibration and irradiation tests of CMOS APS prototypes for EUI, the Extreme Ultraviolet Imager on-board Solar Orbiter

BenMoussa, A., Giordanengo, B., Gissot, S., Meynants, G., Gottwald, A., & Schühle, U. (2013). EUV calibration and irradiation tests of CMOS APS prototypes for EUI, the Extreme Ultraviolet Imager on-board Solar Orbiter. In The Thematic Network for Ultraviolet Measurements (UVNet) Newsletter UVNews 9.

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BenMoussa, A., Author
Giordanengo, B., Author
Gissot, S., Author
Meynants, G., Author
Gottwald, A., Author
Schühle, U.1, 2, Author           
Affiliations:
1MPI for Aeronomy, Max Planck Institute for Solar System Research, Max Planck Society, ou_1832291              
2Department Sun and Heliosphere, Max Planck Institute for Solar System Research, Max Planck Society, ou_1832289              

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 MPIS_GROUPS: Sun and Heliosphere
 MPIS_PROJECTS: SOLAR ORBITER
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 Dates: 2013
 Publication Status: Issued
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 Rev. Type: No review
 Identifiers: BibTex Citekey: BenMoussa:2013-017
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Title: The Thematic Network for Ultraviolet Measurements (UVNet) Newsletter UVNews 9
Source Genre: Proceedings
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