EUV calibration and irradiation tests of CMOS APS prototypes for EUI, the 
Extreme Ultraviolet Imager on-board Solar Orbiter

BenMoussa, A.; Giordanengo, B.; Gissot, S.; Meynants, G.; Gottwald, A.; Schühle, U.

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Conference Paper

EUV calibration and irradiation tests of CMOS APS prototypes for EUI, the Extreme Ultraviolet Imager on-board Solar Orbiter

MPS-Authors

/persons/resource/persons104197

Schühle, U.
MPI for Aeronomy, Max Planck Institute for Solar System Research, Max Planck Society;
Department Sun and Heliosphere, Max Planck Institute for Solar System Research, Max Planck Society;

External Resource

Link
(Any fulltext)

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

BenMoussa, A., Giordanengo, B., Gissot, S., Meynants, G., Gottwald, A., & Schühle, U. (2013). EUV calibration and irradiation tests of CMOS APS prototypes for EUI, the Extreme Ultraviolet Imager on-board Solar Orbiter. In The Thematic Network for Ultraviolet Measurements (UVNet) Newsletter UVNews 9.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0015-0A6D-9

Abstract

There is no abstract available