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  TEM Characterisation of YNi2B2C Thin Film Microstructure

Cao, G. H., Simon, P., Skrotzki, W., Wimbush, S. C., & Holzapfel, B. (2005). TEM Characterisation of YNi2B2C Thin Film Microstructure. Applied Physics A, Supplement, 81(3), 583-585. doi:10.1007/s00339-004-2768-x.

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 Creators:
Cao, G. H., Author
Simon, P.1, Author              
Skrotzki, W., Author
Wimbush, S. C., Author
Holzapfel, B., Author
Affiliations:
1Paul Simon, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863418              

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 Abstract: A thin film of the superconductor YNi2B2C deposited on an MgO(001) substrate by pulsed laser deposition has been investigated by transmission electron microscopy (TEM). Plan-view TEM analyses show that the YNi2B2C film consists of isolated rectangular grains distributed within a second phase. This phase was identified as the monoclinic phase Y2Ni15B6 with lattice parameters a=1.422 nm,b=1.067 nm,c=0.958 nm and β=95°. Additionally, the cubic phase Y2O3 with lattice constant a=1.06 nm was identified within the film.

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Language(s): eng - English
 Dates: 2005-08-01
 Publication Status: Published in print
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 236406
DOI: 10.1007/s00339-004-2768-x
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Title: Applied Physics A, Supplement
Source Genre: Journal
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Publ. Info: Heidelberg : Springer-Verlag Heidelberg
Pages: - Volume / Issue: 81 (3) Sequence Number: - Start / End Page: 583 - 585 Identifier: ISSN: 0947-8396
CoNE: https://pure.mpg.de/cone/journals/resource/954928582869