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  Effect of Layer-by-Layer Electrostatic Assemblies on the Surface Potential and Current Voltage Characteristic of Metal-Insulator-Semiconductor Structures

Gorin, D. A., Yashchenok, A. M., Manturov, A. O., Kolesnikova, T. A., & Möhwald, H. (2009). Effect of Layer-by-Layer Electrostatic Assemblies on the Surface Potential and Current Voltage Characteristic of Metal-Insulator-Semiconductor Structures. Langmuir, 25(21), 12529-12534.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-4EC1-5 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-4EC2-3
Genre: Journal Article

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442791.pdf (Any fulltext), 3MB
 
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 Creators:
Gorin, D. A.1, Author              
Yashchenok, A. M.2, Author              
Manturov, A. O., Author
Kolesnikova, T. A.1, Author              
Möhwald, H.2, Author              
Affiliations:
1Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863287              
2Helmuth Möhwald, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863312              

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Language(s): eng - English
 Dates: 2009-11-03
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: eDoc: 442791
ISI: 000271106600024
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Title: Langmuir
  Alternative Title : Langmuir
Source Genre: Journal
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Pages: - Volume / Issue: 25 (21) Sequence Number: - Start / End Page: 12529 - 12534 Identifier: ISSN: 0743-7463