English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
 Local TagsRelease HistoryDetailsSummary
  Quantitative defect analysis using electron channeling contrast imaging under controlled diffraction conditions (cECCI)

Elhami, N., Tasan, C. C., & Zaefferer, S. (2012). Quantitative defect analysis using electron channeling contrast imaging under controlled diffraction conditions (cECCI). In J. Shields, S. McKernan, L. Brewer, T. Ruiz, & D. Turnquist (Eds.), Proceedings of M&M 2012 (pp. 690-691). Microscopy Society of America.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2DE5-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-3484-9
Genre: Conference Paper

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Elhami, N.1, Author           
Tasan, C. C.2, Author           
Zaefferer, S.1, Author           
Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              
2Adaptive Structural Materials (Experiment), Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863382              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2012
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 625675
 Degree: -

Event

show
hide
Title: Microscopy & Microanalysis 2012
Place of Event: Phoenix, AZ, USA
Start-/End Date: 2012-07-29 - 2012-08-02

Legal Case

show

Project information

show

Source 1

show
hide
Title: Proceedings of M&M 2012
Source Genre: Proceedings
 Creator(s):
Shields, J., Editor
McKernan, S., Editor
Brewer, L., Editor
Ruiz, T., Editor
Turnquist, D., Editor
Affiliations:
-
Publ. Info: Microscopy Society of America
Pages: CD-ROM Volume / Issue: - Sequence Number: - Start / End Page: 690 - 691 Identifier: -