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  Quantitative defect analysis using electron channeling contrast imaging under controlled diffraction conditions (cECCI)

Elhami, N., Tasan, C. C., & Zaefferer, S. (2012). Quantitative defect analysis using electron channeling contrast imaging under controlled diffraction conditions (cECCI). In J. Shields, S. McKernan, L. Brewer, T. Ruiz, & D. Turnquist (Eds.), Proceedings of M&M 2012 (pp. 690-691). Microscopy Society of America.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2DE5-B Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-3484-9
Genre: Conference Paper

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 Creators:
Elhami, N.1, Author              
Tasan, C. C.2, Author              
Zaefferer, S.1, Author              
Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              
2Adaptive Structural Materials (Experiment), Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863382              

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Language(s): eng - English
 Dates: 2012
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 625675
 Degree: -

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Title: Microscopy & Microanalysis 2012
Place of Event: Phoenix, AZ, USA
Start-/End Date: 2012-07-29 - 2012-08-02

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Title: Proceedings of M&M 2012
Source Genre: Proceedings
 Creator(s):
Shields, J., Editor
McKernan, S., Editor
Brewer, L., Editor
Ruiz, T., Editor
Turnquist, D., Editor
Affiliations:
-
Publ. Info: Microscopy Society of America
Pages: CD-ROM Volume / Issue: - Sequence Number: - Start / End Page: 690 - 691 Identifier: -