In-situ ellipsometric monitoring of electrochemical preparation of ZnO 
nanoplates

Chen, Y.; Schneider, P.; Erbe, A.

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In-situ ellipsometric monitoring of electrochemical preparation of ZnO nanoplates

Chen, Y., Schneider, P., & Erbe, A. (2011). In-situ ellipsometric monitoring of electrochemical preparation of ZnO nanoplates. Talk presented at 62nd Annual Meeting of the International Society of Electrochemistry. Niigata, Japan. 2011-09-11 - 2011-09-16.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3007-C Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3009-8

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Urheber:
Chen, Y.¹, Autor
Schneider, P.¹, Autor
Erbe, A.¹, Autor

Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358