In-situ ellipsometric monitoring of electrochemical preparation of ZnO 
nanoplates

Chen, Y.; Schneider, P.; Erbe, A.

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Talk

In-situ ellipsometric monitoring of electrochemical preparation of ZnO nanoplates

MPS-Authors

/persons/resource/persons125086

Chen, Y.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125376

Schneider, P.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125132

Erbe, A.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Chen, Y., Schneider, P., & Erbe, A. (2011). In-situ ellipsometric monitoring of electrochemical preparation of ZnO nanoplates. Talk presented at 62nd Annual Meeting of the International Society of Electrochemistry. Niigata, Japan. 2011-09-11 - 2011-09-16.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-3007-C

Abstract

There is no abstract available