In-situ ellipsometric monitoring of electrochemical preparation of ZnO 
nanoplates

Chen, Y.; Schneider, P.; Erbe, A.

Local TagsRelease HistoryDetailsSummary

In-situ ellipsometric monitoring of electrochemical preparation of ZnO nanoplates

Chen, Y., Schneider, P., & Erbe, A. (2011). In-situ ellipsometric monitoring of electrochemical preparation of ZnO nanoplates. Talk presented at 62nd Annual Meeting of the International Society of Electrochemistry. Niigata, Japan. 2011-09-11 - 2011-09-16.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3007-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3009-8

Genre: Talk

Files

show Files

Locators

show

Creators

show

hide

Creators:
Chen, Y.¹, Author
Schneider, P.¹, Author
Erbe, A.¹, Author

Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358

Content

show

Details

show

hide

Language(s): eng - English

Dates:

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 580579

Degree: -

Event

show

hide

Title: 62nd Annual Meeting of the International Society of Electrochemistry

Place of Event: Niigata, Japan

Start-/End Date: 2011-09-11 - 2011-09-16

Legal Case

show

Project information

show

Source

show