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  Antireflective layers on thin metal films for mid‐infrared internal reflection spectroscopy

Reithmeier, M., & Erbe, A. (2010). Antireflective layers on thin metal films for mid‐infrared internal reflection spectroscopy. Talk presented at Optical Interference Coatings - Topical Meeting. Tucson, Arizona, USA. 2010-06 - 2010-06.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-38F4-B Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-38F6-7
Genre: Talk

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 Creators:
Reithmeier, M.1, Author              
Erbe, A.1, Author              
Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Rev. Type: -
 Identifiers: eDoc: 476855
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Title: Optical Interference Coatings - Topical Meeting
Place of Event: Tucson, Arizona, USA
Start-/End Date: 2010-06 - 2010-06

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