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  3D orientation microscopy in a FIB-SEM: A new dimension of microstructure characterisation

Zaefferer, S. (2007). 3D orientation microscopy in a FIB-SEM: A new dimension of microstructure characterisation. Talk presented at Res Metallica Chair 2007. KU Leuven, Belgium. 2007-03-07.

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 Creators:
Zaefferer, S.1, Author           
Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 379765
 Degree: -

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Title: Res Metallica Chair 2007
Place of Event: KU Leuven, Belgium
Start-/End Date: 2007-03-07
Invited: Yes

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