Three Dimensional Orientation Microscopy Electron Backscatter Diffraction in a 
combined FIB/SEM

Wright, S. I.; Zaefferer, S.

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Three Dimensional Orientation Microscopy Electron Backscatter Diffraction in a combined FIB/SEM

Wright, S. I., & Zaefferer, S. (2007). Three Dimensional Orientation Microscopy Electron Backscatter Diffraction in a combined FIB/SEM. GIT Imaging & Microscopy, 4, 40-41.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-563D-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-563F-4

Genre: Journal Article

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Creators:
Wright, S. I., Author
Zaefferer, S.¹, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

Dates: Date issued: 2007

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 379439

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Title: GIT Imaging & Microscopy

Source Genre: Journal

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Pages: - Volume / Issue: 4 Sequence Number: - Start / End Page: 40 - 41 Identifier: -