Three Dimensional Orientation Microscopy Electron Backscatter Diffraction in a 
combined FIB/SEM

Wright, S. I.; Zaefferer, S.

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Three Dimensional Orientation Microscopy Electron Backscatter Diffraction in a combined FIB/SEM

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Zaefferer, S.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Wright, S. I., & Zaefferer, S. (2007). Three Dimensional Orientation Microscopy Electron Backscatter Diffraction in a combined FIB/SEM. GIT Imaging & Microscopy, 4, 40-41.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-563D-8

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