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  Height-regulating scanning Kelvin probe for simultaneous measurement of surface topology and electrode potentials at buried polymer/metal interfaces

Wapner, K., Schoenberger, B., Stratmann, M., & Grundmeier, G. (2005). Height-regulating scanning Kelvin probe for simultaneous measurement of surface topology and electrode potentials at buried polymer/metal interfaces. Journal of the Electrochemical Society, 152(3), E114-E122. doi:10.1149/1.1856914.

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 Creators:
Wapner, K.1, Author           
Schoenberger, B.2, Author
Stratmann, M.3, Author           
Grundmeier, G.1, 4, Author           
Affiliations:
1Adhesion and Thin Films, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863349              
2Max Planck Society, ou_persistent13              
3Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863348              
4Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863353              

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Language(s): eng - English
 Dates: 20052005
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 224488
DOI: 10.1149/1.1856914
 Degree: -

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Title: Journal of the Electrochemical Society
  Alternative Title : J. Electrochem. Soc.
Source Genre: Journal
 Creator(s):
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Publ. Info: -
Pages: - Volume / Issue: 152 (3) Sequence Number: - Start / End Page: E114 - E122 Identifier: -