Height-regulating scanning Kelvin probe for simultaneous measurement of surface 
topology and electrode potentials at buried polymer/metal interfaces

Wapner, K.; Schoenberger, B.; Stratmann, M.; Grundmeier, G.

doi:10.1149/1.1856914

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Height-regulating scanning Kelvin probe for simultaneous measurement of surface topology and electrode potentials at buried polymer/metal interfaces

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Wapner, K.
Adhesion and Thin Films, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

Schoenberger, B.
Max Planck Society;

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Stratmann, M.
Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Grundmeier, G.
Adhesion and Thin Films, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Wapner, K., Schoenberger, B., Stratmann, M., & Grundmeier, G. (2005). Height-regulating scanning Kelvin probe for simultaneous measurement of surface topology and electrode potentials at buried polymer/metal interfaces. Journal of the Electrochemical Society, 152(3), E114-E122. doi:10.1149/1.1856914.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-6153-8

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