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  EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films Deposited on MgO Substrates

Rashkova, B., Zhang, Z., Šturm, S., Kothleitner, G., Kutschej, K., Mitterer, C., et al. (2009). EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films Deposited on MgO Substrates. In G. Kothleitner (Ed.), 9th Multinational Microscopy Conference 2009 (pp. 285-286). Graz, Austria: Verlag der Technischen Universität Graz.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-5556-F Version Permalink: http://hdl.handle.net/21.11116/0000-0001-6D46-7
Genre: Conference Paper

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 Creators:
Rashkova, Boryana1, 2, Author              
Zhang, Zaoli3, Author              
Šturm, Sašo4, Author              
Kothleitner, Gerald5, Author              
Kutschej, Kerstin6, Author              
Mitterer, Christian7, Author              
Lazar, Petr8, Author              
Redinger, Josef8, Author              
Podloucky, Raimund9, Author              
Scheu, Christina10, Author              
Dehm, Gerhard1, 2, Author              
Affiliations:
1Erich-Schmid-Institute of Materials Science, Austrian Academy of Sciences, Jahnstrasse 12, 8700 Leoben, Austria, ou_persistent22              
2Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              
3Erich Schmid Institute of Material Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              
4Institut Jožef Stefan, Department for Nanostructured Materials, Ljubljana, Slovenia, ou_persistent22              
5Institut für Elektronenmikroskopie und Nanoanalytik, Technische Universität Graz, Austria, ou_persistent22              
6Department of Physical Metallurgy and Materials Testing, University of Leoben, Franz-Josef-Str. 18, A-8700 Leoben, Austria, ou_persistent22              
7Department of Physical Metallurgy and Materials Testing, Christian-Doppler Laboratory for Advanced Coatings, University of Leoben, Austria, ou_persistent22              
8Institute of Applied Physics, Vienna University of Technology, Vienna, Austria, ou_persistent22              
9Department of Physical Chemistry, Vienna University, Vienna, Austria, ou_persistent22              
10Department Physical Metallurgy and Materials Testing, Montanuniversität Leoben, Franz-Josef-Str. 18, 8700 Leoben, Austria, ou_persistent22              

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Language(s): eng - English
 Dates: 2009
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: URI: www.univie.ac.at/asem
 Degree: -

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Title: 9th Multinational Microscopy Conference 2009
Place of Event: Graz, Austria
Start-/End Date: 2009-08-30 - 2008-09-04

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Title: 9th Multinational Microscopy Conference 2009
Source Genre: Proceedings
 Creator(s):
Kothleitner, Gerald1, Editor            
Leisch, Manfred2, Author            
Affiliations:
1 Institut für Elektronenmikroskopie und Nanoanalytik, Technische Universität Graz, Austria, ou_persistent22            
2 Institute for Solid State Physics, Technische Universitat Graz, Austria, ou_persistent22            
Publ. Info: Graz, Austria : Verlag der Technischen Universität Graz
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 285 - 286 Identifier: -