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  In Situ µLaue: Instrumental Setup for the Deformation of Micron Sized Samples

Kirchlechner, C., Kečkéš, J., Micha, J.-S., & Dehm, G. (2011). In Situ µLaue: Instrumental Setup for the Deformation of Micron Sized Samples. Advanced Engineering Materials, 13(8), 837-844.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-001A-24E3-E Version Permalink: http://hdl.handle.net/11858/00-001M-0000-001A-24E9-2
Genre: Journal Article
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 Creators:
Kirchlechner, C.1, 2, Author              
Kečkéš, J.2, Author              
Micha, J.-S.3, 4, Author              
Dehm, G.1, 2, Author              
Affiliations:
1Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              
2Department of Materials Physics, Montanuniversität Leoben, Leoben, Austria, ou_persistent22              
3CEA-Grenoble, Institut Nanosciences et Cryogénie, Grenoble, France, ou_persistent22              
4CRG-IF BM32 at ESRF, France, ou_persistent22              

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 Abstract: mLaue diffraction sheds light onto the deformation behavior of miniaturized samples. Here we present a new instrumental setup for the in situ deformation of micron sized specimens at BM32 of the ESRF synchrotron source. Furthermore, a compression test of a 7mm sized single slip oriented copper pillar is presented, showing the activation of an unpredicted slip system due to misalignment and the formation of several sub-grains. The results of the compressed pillar as well as possibilities and crucial points for measuring and data evaluation are discussed.

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Language(s): eng - English
 Dates: 2011-08
 Publication Status: Published in print
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Title: Advanced Engineering Materials
Source Genre: Journal
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Publ. Info: Weinheim : WILEY-VCH Verlag
Pages: - Volume / Issue: 13 (8) Sequence Number: - Start / End Page: 837 - 844 Identifier: ISSN: 1438-1656
CoNE: /journals/resource/958634688014