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Abstract:
mLaue diffraction sheds light onto the deformation behavior of miniaturized samples. Here we present a new instrumental setup for the in situ deformation of micron sized specimens at BM32 of the ESRF synchrotron source. Furthermore, a compression test of a 7mm sized single slip oriented copper pillar is presented, showing the activation of an unpredicted slip system due to misalignment and the formation of several sub-grains. The results of the compressed pillar as well as possibilities and crucial points for measuring and data evaluation are discussed.