Stoffers, A., Cojocaru-Mirédin, O., Seifert, W., Zaefferer, S., & Raabe, D. (2014). A correlative EBSD, EBIC and APT study of grain boundary segregation in multicrystalline silicon. Talk presented at Atom Probe Tomography & Microscopy 2014. Stuttgart, Germany. 2014-08-31 - 2014-09-05.