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  Quantitative photoemission depth profiling - A new approach to the surface analysis of real materials

Merzlikin, S. V. (2006). Quantitative photoemission depth profiling - A new approach to the surface analysis of real materials. Poster presented at 5. Materialwissenschaftlicher Tag in RUB, Bochum, Germany.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0025-087B-5 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0025-087D-1
Genre: Poster

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 Creators:
Merzlikin, Sergiy Vasil´ović1, Author              
Affiliations:
1Lehrstuhl für Technische Chemie, Ruhr-Universität Bochum, Postfach 102148, 44780 Bochum, Germany, ou_persistent22              

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Language(s): eng - English
 Dates: 2006
 Publication Status: Not specified
 Pages: -
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 Rev. Method: -
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 Degree: -

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Title: 5. Materialwissenschaftlicher Tag in RUB
Place of Event: Bochum, Germany
Start-/End Date: 2006-10-18

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