Quantitative photoemission depth profiling - A new approach to the surface 
analysis of real materials

Merzlikin, Sergiy Vasil´ović

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Quantitative photoemission depth profiling - A new approach to the surface analysis of real materials

Merzlikin, S. V. (2006). Quantitative photoemission depth profiling - A new approach to the surface analysis of real materials. Poster presented at 5. Materialwissenschaftlicher Tag in RUB, Bochum, Germany.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0025-087B-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0025-087D-1

Genre: Poster

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Creators:
Merzlikin, Sergiy Vasil´ović¹, Author

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1Lehrstuhl für Technische Chemie, Ruhr-Universität Bochum, Postfach 102148, 44780 Bochum, Germany, ou_persistent22

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Language(s): eng - English

Dates: Created: 2006

Publication Status: Not specified

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Title: 5. Materialwissenschaftlicher Tag in RUB

Place of Event: Bochum, Germany

Start-/End Date: 2006-10-18

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