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  Time-of-flight mass-spectrometer for plasma analysis

Zalach, J., & Wiesemann, K. (2003). Time-of-flight mass-spectrometer for plasma analysis. In J. Meichsner, D. Loffhagen, & H.-E. Wagner (Eds.), 26th International Conference on Phenomena in Ionized Gases. Vol. 1 (pp. 187-188).

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 Creators:
Zalach, J.1, 2, Author              
Wiesemann, K., Author
Affiliations:
1VINETA, Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856311              
2Stellarator Scenario Development (E5), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856285              

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 Abstract: We describe a Time-of-Flight Mass-Spectrometer (TOF-MS) specially designed for plasma ion analysis at continously running discharges and for heavy ions. After an outline of the concept we present first results in the mass range 0 <m < 100 u.

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Language(s): eng - English
 Dates: 2003
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 60026
 Degree: -

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Title: ICPIG 2003
Place of Event: Greifswald (DE)
Start-/End Date: 2003-07-15 - 2003-07-20

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Title: 26th International Conference on Phenomena in Ionized Gases. Vol. 1
Source Genre: Proceedings
 Creator(s):
Meichsner, J., Editor
Loffhagen, D., Editor
Wagner, H.-E., Editor
Affiliations:
-
Publ. Info: -
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 187 - 188 Identifier: ISBN: 3-00-011689-3