Time-of-flight mass-spectrometer for plasma analysis

Zalach, J.; Wiesemann, K.

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Time-of-flight mass-spectrometer for plasma analysis

Zalach, J., & Wiesemann, K. (2003). Time-of-flight mass-spectrometer for plasma analysis. In J. Meichsner, D. Loffhagen, & H.-E. Wagner (Eds.), 26th International Conference on Phenomena in Ionized Gases. Vol. 1 (pp. 187-188).

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-3C2F-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-3C30-3

Genre: Conference Paper

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Creators:
Zalach, J.^{1, 2}, Author
Wiesemann, K., Author

Affiliations:
1VINETA, Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856311
2Stellarator Scenario Development (E5), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856285

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Abstract: We describe a Time-of-Flight Mass-Spectrometer (TOF-MS) specially designed for plasma ion analysis at continously running discharges and for heavy ions. After an outline of the concept we present first results in the mass range 0 <m < 100 u.

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Language(s): eng - English

Dates: Date issued: 2003

Publication Status: Issued

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Rev. Type: Internal

Identifiers: eDoc: 60026

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Title: ICPIG 2003

Place of Event: Greifswald (DE)

Start-/End Date: 2003-07-15 - 2003-07-20

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Title: 26th International Conference on Phenomena in Ionized Gases. Vol. 1

Source Genre: Proceedings

Creator(s):
Meichsner, J., Editor
Loffhagen, D., Editor
Wagner, H.-E., Editor

Affiliations:
-

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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 187 - 188 Identifier: ISBN: 3-00-011689-3