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  Depth profile determination with confidence intervals from Rutherford backscattering data

von Toussaint, U., Fischer, R., Krieger, K., & Dose, V. (1999). Depth profile determination with confidence intervals from Rutherford backscattering data. New Journal of Physics, 1: 11. Retrieved from http://www.iop.org/EJ/abstract/1367-2630/1/1/311.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-848C-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-848D-3
Genre: Journal Article

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 Creators:
von Toussaint, U.1, Author           
Fischer, R.1, Author           
Krieger, K.1, Author           
Dose, V.1, Author           
Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288              

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Language(s): eng - English
 Dates: 1999
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 233349
URI: http://www.iop.org/EJ/abstract/1367-2630/1/1/311
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Title: New Journal of Physics
  Alternative Title : NJP
Source Genre: Journal
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Publ. Info: IOP Publishing Ltd and Deutsche Physikalische Gesellschaft
Pages: - Volume / Issue: 1 Sequence Number: 11 Start / End Page: - Identifier: ISSN: 1367-2630