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  Ion beam analysis of oxidised a-C:D layers on Be - A comparison of 4He RBS and 28Si ERD analysis

Roth, J., Walsh, D. S., Wampler, W. R., & Mayer, M. (1998). Ion beam analysis of oxidised a-C:D layers on Be - A comparison of 4He RBS and 28Si ERD analysis. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 136-138, 689-694. doi:10.1016/S0168-583X(97)00774-X.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-88A4-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-88A5-9
Genre: Journal Article

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 Creators:
Roth, J.1, Author           
Walsh, D. S.2, Author
Wampler, W. R.2, Author
Mayer, M.1, Author           
Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288              
2Sandia National Laboratories, Albuquerque, NM 87185, USA, ou_persistent22              

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Free keywords: 13th International Conference on Ion Beam Analysis (IBA-13), Lisbon, 1997-07-27 to 1997-08-01
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Language(s): eng - English
 Dates: 1998
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 627877
DOI: 10.1016/S0168-583X(97)00774-X
URI: http://dx.doi.org/10.1016/S0168-583X(97)00774-X
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Title: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Source Genre: Journal
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Affiliations:
Publ. Info: Elsevier B.V.
Pages: - Volume / Issue: 136-138 Sequence Number: - Start / End Page: 689 - 694 Identifier: -