X-ray photoelectron spectroscopy study of TiC films grown by annealing thin Ti 
films on graphite

Miller, S.; Berning, G. L. P.; Plank, H.; Roth, J.

doi:10.1116/1.580675

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X-ray photoelectron spectroscopy study of TiC films grown by annealing thin Ti films on graphite

Miller, S., Berning, G. L. P., Plank, H., & Roth, J. (1997). X-ray photoelectron spectroscopy study of TiC films grown by annealing thin Ti films on graphite. Journal of Vacuum Science and Technology A, 15(4), 2029-2034. doi:10.1116/1.580675.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-89CB-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-89CC-9

Genre: Journal Article

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Creators:
Miller, S.¹, Author
Berning, G. L. P., Author
Plank, H.¹, Author
Roth, J.¹, Author

Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288

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Language(s): eng - English

Dates: Date issued: 1997

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 624659
DOI: 10.1116/1.580675
URI: http://avspublications.org/jvsta/resource/1/jvtad6/v15/i4/p2029_s1

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Title: Journal of Vacuum Science and Technology A

Source Genre: Journal

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Pages: - Volume / Issue: 15 (4) Sequence Number: - Start / End Page: 2029 - 2034 Identifier: -