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  X-ray photoelectron spectroscopy study of TiC films grown by annealing thin Ti films on graphite

Miller, S., Berning, G. L. P., Plank, H., & Roth, J. (1997). X-ray photoelectron spectroscopy study of TiC films grown by annealing thin Ti films on graphite. Journal of Vacuum Science and Technology A, 15(4), 2029-2034. doi:10.1116/1.580675.

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 Creators:
Miller, S.1, Author              
Berning, G. L. P., Author
Plank, H.1, Author              
Roth, J.1, Author              
Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288              

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Language(s): eng - English
 Dates: 1997
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Degree: -

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Title: Journal of Vacuum Science and Technology A
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 15 (4) Sequence Number: - Start / End Page: 2029 - 2034 Identifier: -