Secondary electron emission coefficient of C:H and Si:C thin films and some 
relations to their morphology and composition

Groudeva-Zotova, S.; Jacob, W.; Keudell, A. von

doi:10.1016/0925-9635(96)00535-3

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Secondary electron emission coefficient of C:H and Si:C thin films and some relations to their morphology and composition

Groudeva-Zotova, S., Jacob, W., & Keudell, A. v. (1996). Secondary electron emission coefficient of C:H and Si:C thin films and some relations to their morphology and composition. Diamond and Related Materials, 5(10), 1087-1095. doi:10.1016/0925-9635(96)00535-3.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-8D0A-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-8D0B-E

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Creators:
Groudeva-Zotova, S., Author
Jacob, W.¹, Author
Keudell, A. von¹, Author

Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288

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Language(s): eng - English

Dates: Date issued: 1996

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 626330
DOI: 10.1016/0925-9635(96)00535-3
URI: http://www.sciencedirect.com/science/article/pii/0925963596005353

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Title: Diamond and Related Materials

Source Genre: Journal

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Pages: - Volume / Issue: 5 (10) Sequence Number: - Start / End Page: 1087 - 1095 Identifier: -