HREEL spectroscopy of thin ion beam deposited C:H(D) films

Biener, J.; Schenk, A.; Winter, B.; Küppers, J.

doi:10.1016/0368-2048(93)80095-4

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HREEL spectroscopy of thin ion beam deposited C:H(D) films

Biener, J., Schenk, A., Winter, B., & Küppers, J. (1993). HREEL spectroscopy of thin ion beam deposited C:H(D) films. Journal of Electron Spectroscopy and Related Phenomena, 331-339. doi:10.1016/0368-2048(93)80095-4.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-91DC-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-91DD-8

Genre: Journal Article

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Creators:
Biener, J.¹, Author
Schenk, A.¹, Author
Winter, B.¹, Author
Küppers, J.¹, Author

Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288

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Free keywords: 7th International Conference on Vibration of Surfaces, Genua, Italy, 1993-06-14 to 1993-06-17

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Language(s): eng - English

Dates: Date issued: 1993

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 630956
DOI: 10.1016/0368-2048(93)80095-4
URI: http://www.sciencedirect.com/science/article/pii/0368204893800954#

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Title: Journal of Electron Spectroscopy and Related Phenomena

Source Genre: Journal

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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 331 - 339 Identifier: -