Zaefferer, S., Elhami, N. N., Konijnenberg, P. J., & Jäpel, T. (2013). Quantitative Microstructure Characterization by Application of Advanced SEM-Based Electron Diffraction Techniques. Talk presented at Microscopy and Microanalysis 2013. Indianapolis, IN, USA. 2013-08-04 - 2013-08-08.