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Quantitative Microstructure Characterization by Application of Advanced SEM-Based Electron Diffraction Techniques

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/persons/resource/persons125491

Zaefferer,  Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Elhami,  Nahid Nora
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125228

Konijnenberg,  Peter Joachim
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Jäpel,  Tom
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Zaefferer, S., Elhami, N. N., Konijnenberg, P. J., & Jäpel, T. (2013). Quantitative Microstructure Characterization by Application of Advanced SEM-Based Electron Diffraction Techniques. Talk presented at Microscopy and Microanalysis 2013. Indianapolis, IN, USA. 2013-08-04 - 2013-08-08.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-4191-D
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