English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
  Interwire coupling for In(4 x 1)/Si(111) probed by surface transport

Edler, F., Miccoli, I., Demuth, S., Pfnür, H. E., Wippermann, S. M., Lücke, A., et al. (2015). Interwire coupling for In(4 x 1)/Si(111) probed by surface transport. Physical Review B, 92(8): 085426. doi:10.1103/PhysRevB.92.085426.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-4CFB-7 Version Permalink: http://hdl.handle.net/21.11116/0000-0002-5141-9
Genre: Journal Article

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Edler, Frederik1, Author              
Miccoli, Ilio1, 2, Author              
Demuth, S.3, Author              
Pfnür, Herbert E.1, Author              
Wippermann, Stefan Martin4, Author              
Lücke, Andreas5, Author              
Schmidt, W. G.6, 7, Author              
Tegenkamp, Christoph1, Author              
Affiliations:
1Institut für Festkörperphysik, Leibniz Universität Hannover, Appelstrasse 2, Hannover, Germany, ou_persistent22              
2Dipartimento di Ingegneria dell'Innovazione, Università del Salento, Via Monteroni, Lecce, Italy, ou_persistent22              
3Institut für Festkörperphysik, Leibniz Universität Hannover, Appelstraße 2, 30167 Hannover, Germany, ou_persistent22              
4Atomistic Modelling, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863350              
5Lehrstuhl für Theoretische Physik, Universität Paderborn, Paderborn, Germany, ou_persistent22              
6Lehrstuhl für Theoretische Physik, Universität Paderborn, 33095 Paderborn, Germany, ou_persistent22              
7Center for Surface and Nanoanalytics, Johannes Kepler University Linz, Altenbergerstr. 69, A-4040 Linz, Austria, ou_persistent22              

Content

show
hide
Free keywords: Materials Science; Physics; Engineering;
 Abstract: The In/Si(111) system reveals an anisotropy in the electrical conductivity and is a prototype system for atomic wires on surfaces. We use this system to study and tune the interwire interaction by adsorption of oxygen. Through rotational square four-tip transport measurements, both the parallel (sigma(parallel to)) and perpendicular (sigma(perpendicular to)) components are measured separately. The analysis of the I(V) curves reveals that sigma(perpendicular to) is also affected by adsorption of oxygen, showing clearly an effective interwire coupling, in agreement with density-functional-theory-based calculations of the transmittance. In addition to these surface-state mediated transport channels, we confirm the existence of conducting parasitic space-charge layer channels and address the importance of substrate steps by performing the transport measurements of In phases grown on Si(111) mesa structures.

Details

show
hide
Language(s): eng - English
 Dates: 2015-08-25
 Publication Status: Published in print
 Pages: 7
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Physical Review B
  Abbreviation : Phys. Rev. B
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Woodbury, NY : American Physical Society
Pages: - Volume / Issue: 92 (8) Sequence Number: 085426 Start / End Page: - Identifier: ISSN: 1098-0121
CoNE: /journals/resource/954925225008