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  Installation of spectrally selective imaging system in RF negative ion source

Ikeda, K., Wünderlich, D., Fantz, U., Heinemann, B., Kisaki, M., Nagaoka, K., et al. (2016). Installation of spectrally selective imaging system in RF negative ion source. Review of Scientific Instruments, 87: 02B113. doi:10.1063/1.4932987.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-DCFE-B Version Permalink: http://hdl.handle.net/21.11116/0000-0002-DF1D-4
Genre: Journal Article

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http://dx.doi.org/10.1063/1.4932987 (Publisher version)
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 Creators:
Ikeda, K.1, Author
Wünderlich, D.2, Author              
Fantz, U.2, Author              
Heinemann, B.2, Author              
Kisaki, M.1, Author
Nagaoka, K.1, Author
Nakano, H.1, Author
Osakabe, M.1, Author
Tsumori, K.1, Author
Geng, S.1, Author
Kaneko, O.1, Author
Takeiri, Y.1, Author
Affiliations:
1External Organizations, ou_persistent22              
2ITER Technology & Diagnostics (ITED), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856290              

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Free keywords: Konferenzbeitrag
 Abstract: -

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Language(s): eng - English
 Dates: 2016
 Publication Status: Published in print
 Pages: 3 p.
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1063/1.4932987
 Degree: -

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Title: Review of Scientific Instruments
  Subtitle : 16th International Conference on Ion Sources (ICIS 2015), New York, NY, 2015-08-23 to 2015-08-28
Source Genre: Journal
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Publ. Info: Melville, NY : AIP Publishing
Pages: - Volume / Issue: 87 Sequence Number: 02B113 Start / End Page: - Identifier: ISSN: 0034-6748
CoNE: /journals/resource/991042742033452