Installation of spectrally selective imaging system in RF negative ion source

Ikeda, K.; Wünderlich, D.; Fantz, U.; Heinemann, B.; Kisaki, M.; Nagaoka, K.; Nakano, H.; Osakabe, M.; Tsumori, K.; Geng, S.; Kaneko, O.; Takeiri, Y.

doi:10.1063/1.4932987

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Journal Article

Installation of spectrally selective imaging system in RF negative ion source

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Wünderlich, D.
ITER Technology & Diagnostics (ITED), Max Planck Institute for Plasma Physics, Max Planck Society;

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Fantz, U.
ITER Technology & Diagnostics (ITED), Max Planck Institute for Plasma Physics, Max Planck Society;

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Heinemann, B.
ITER Technology & Diagnostics (ITED), Max Planck Institute for Plasma Physics, Max Planck Society;

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Ikeda, K., Wünderlich, D., Fantz, U., Heinemann, B., Kisaki, M., Nagaoka, K., et al. (2016). Installation of spectrally selective imaging system in RF negative ion source. Review of Scientific Instruments, 87: 02B113. doi:10.1063/1.4932987.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-DCFE-B

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