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  Stiff polyimides: Chain orientation and anisotropy of the optical and dielectric properties of thin films

Boese, D., Herminghaus, S., Yoon, D. Y., Swalen, J. D., & Rabolt, J. F. (1991). Stiff polyimides: Chain orientation and anisotropy of the optical and dielectric properties of thin films. In D. T. Grubb, I. Mita, & D. Y. Yoon (Eds.), Symposium J - Materials Science of High Temperature Polymers for Microelectronics (pp. 379-379).

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Boese, D., Author           
Herminghaus, Stephan1, Author           
Yoon, D. Y., Author           
Swalen, J. D., Author
Rabolt, J. F., Author
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1Group Granular matter and irreversibility, Department of Dynamics of Complex Fluids, Max Planck Institute for Dynamics and Self-Organization, Max Planck Society, ou_2063306              

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 Abstract: Thin films of poly(p-phenylene biphenyltetracarboximide), prepared by thermal imidization of the precursor poly(amic acid) on substrates, have been investigated by optical waveguide, UV-visible, infrared (IR), and dielectric spectroscopies. The polyimide films exhibit an extraordinarily large anisotropy in the refractive indices with the in-plane index n║ = 1.852 and the out-of-plane index n┴ = 1.612 at 632.8 nm wavelength, indicating a strong preference of polymer chains to orient along the film plane. No discernible effect of the film thickness on this optical anisotropy is found in the range of ca. 0.4 μm to 7.8 μm in thickness. The frequency dispersion of the in-plane refractive index to 1.06 μm wavelength is consistent with the results calculated by the Lorentz-Lorenz equation from the UV-visible spectrum. The contribution from the entire IR range from 7000 to 200 cm,−1 computed by the Spitzer-Kleinmann dispersion relations from the measured spectra, adds ca. 0.07 to the in-plane refractive index n║. Approximately the same increase is assumed for the out-of-plane index n┴, based on the tilt-angle dependent IR results. Application of the Maxwell relation leads to the out-of-plane dielectric constant ε┴≃2.8 at ca. 1013 Hz, as compared with the measured value of ca. 3.0 at 106 Hz. Assuming this small difference to remain the same for the in-plane dielectric constants ε║, we obtain a a very large anisotropy in the dielectric properties of these polyimide films with the estimated in-plane dielectric constant ε║≃3.5 at ca. 1013 Hz, and ε.≃3.7 at 106 Hz.

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Language(s): eng - English
 Dates: 1991
 Publication Status: Issued
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 Identifiers: DOI: 10.1557/PROC-227-379
BibTex Citekey: OPL:8101580
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Title: 1991 MRS Spring Meeting - Symposium J – Materials Science of High Temperature Polymers for Microelectronics
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Title: Symposium J - Materials Science of High Temperature Polymers for Microelectronics
Source Genre: Proceedings
 Creator(s):
Grubb, D. T., Editor
Mita, I., Editor
Yoon, D. Y., Editor
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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 379 - 379 Identifier: -

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Title: MRS Proceedings
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Pages: - Volume / Issue: 227 Sequence Number: - Start / End Page: - Identifier: -