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  Optimizing polarization dependent hard X-ray photoemission experiments for solids

Weinen, J., Koethe, T. C., Agrestini, S., Kasinathan, D., Strigari, F., Haupricht, T., et al. (2016). Optimizing polarization dependent hard X-ray photoemission experiments for solids. In J. C. Woicik (Ed.), Hard X-ray Photoelectron Spectroscopy (HAXPES) (pp. 263-275). Cham: Springer.

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 Urheber:
Weinen, J.1, Autor           
Koethe, T. C.2, Autor
Agrestini, S.3, Autor           
Kasinathan, D.1, Autor           
Strigari, F.2, Autor
Haupricht, T.2, Autor
Liao, Y. F.2, Autor
Tsuei, K.-D.2, Autor
Tjeng, L. H.4, Autor           
Affiliations:
1Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863404              
2External Organizations, ou_persistent22              
3Stefano Agrestini, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863459              
4Liu Hao Tjeng, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863452              

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 Zusammenfassung: Polarization dependent hard X-ray photoemission (HAXPES) experiments are a very powerful tool to identify the nature of the orbitals contributing to the valence band. To optimize this type of experiments we have set up a photoelectron spectroscopy system consisting of two electron energy analyzers mounted such that one detects the photoelectrons propagating parallel to the polarization vector (E) of the light and the other perpendicular. This method has the advantage over using phase retarders (to rotate the E-vector of the light) that the full intensity and full polarization of the light is available for the experiments. Using NiO as an example, we are able to identify reliably the Ni 3d spectral weight of the valence band and at the same time demonstrate the importance of the Ni 4s for the chemical stability of the compound. We have also discovered the limitations of this type of polarization dependent experiments: the polarization dependence is less than expected on the basis of calculations for free atoms and we can ascribe this incompleteness of the polarization dependence to the presence of appreciable side-scattering effects of the outgoing electrons, even at these high kinetic energies in the 6–8 keV range. © Springer International Publishing Switzerland 2016.

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Sprache(n): eng - English
 Datum: 2016-01-28
 Publikationsstatus: Erschienen
 Seiten: -
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: -
 Identifikatoren: DOI: 10.1007/978-3-319-24043-5_11
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Titel: Hard X-ray Photoelectron Spectroscopy (HAXPES)
Genre der Quelle: Buch
 Urheber:
Woicik, Joseph C., Herausgeber
Affiliations:
-
Ort, Verlag, Ausgabe: Cham : Springer
Seiten: - Band / Heft: - Artikelnummer: - Start- / Endseite: 263 - 275 Identifikator: DOI: 10.1007/978-3-319-24043-5
ISBN: 978-3-319-24041-1