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  Velocity Map Imaging of Electrons Strong-Field Photoemitted from Si-Nanotip Arrays

Ye, H., Kienitz, J. S., Fang, S., Trippel, S., Swanwick, M. E., Keathley, P. D., et al. (2015). Velocity Map Imaging of Electrons Strong-Field Photoemitted from Si-Nanotip Arrays. Springer Proceedings in Physics, 162, 663-666. doi:10.1007/978-3-319-13242-6_163.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002A-5F60-2 Version Permalink: https://hdl.handle.net/21.11116/0000-0007-0EC9-8
Genre: Conference Paper

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Locator:
http://dx.doi.org/10.1007/978-3-319-13242-6_163 (Publisher version)
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 Creators:
Ye, Hong1, 2, 3, Author           
Kienitz, Jens S.2, 4, Author
Fang, Shaobo2, 4, Author
Trippel, Sebastian2, Author
Swanwick, Michael E.5, Author
Keathley, Phillip D.6, Author
Velásquez-García, Luis F.5, Author
Cirmi, Giovanni2, 4, Author
Rossi, Giulio M.2, 3, Author
Fallahi, Arya2, 4, Author
Mücke, Oliver D.2, 4, Author
Küpper, Jochen2, 3, 4, Author
Kärtner, Franz X.2, 3, 4, 6, Author
Affiliations:
1International Max Planck Research School for Ultrafast Imaging & Structural Dynamics (IMPRS-UFAST), Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_2266714              
2Center for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany, ou_persistent22              
3Department of Physics, University of Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany, ou_persistent22              
4The Hamburg Center for Ultrafast Imaging, University of Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany, ou_persistent22              
5Microsystems Technology Laboratories, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA, ou_persistent22              
6Department of Electrical Engineering and Computer Science and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA 02139, USA, ou_persistent22              

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Free keywords: -
 Abstract: We observe the electron velocity/momentum distributions due to three-photon ionization and strong-field photoemission from Si-nanotip arrays using velocity map imaging.

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Language(s): eng - English
 Dates: 2015-01-252015
 Publication Status: Issued
 Pages: 4
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: DOI: 10.1007/978-3-319-13242-6_163
 Degree: -

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Title: 19th International Conference on Ultrafast Phenomena
Place of Event: Okinawa Convention Center, Okinawa, Japan
Start-/End Date: 2014-07-07 - 2014-07-11

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Title: Springer Proceedings in Physics
  Subtitle : Ultrafast Phenomena XIX
Source Genre: Journal
 Creator(s):
Yamanouchi, Kaoru1, Editor
Cundiff, Steven2, Editor
de Vivie-Riedle, Regina3, Editor
Kuwata-Gonokami, Makoto4, Editor
DiMauro, Louis5, Editor
Affiliations:
1 Department of Chemistry, The University of Tokyo, ou_persistent22            
2 JILA, University of Colorado, ou_persistent22            
3 Department of Chemistry, Ludwig-Maximilians-University, ou_persistent22            
4 Department of Physics, The University of Tokyo , ou_persistent22            
5 Department of Physics, The Ohio State University, ou_persistent22            
Publ. Info: Berlin : Springer-Verlag
Pages: - Volume / Issue: 162 Sequence Number: - Start / End Page: 663 - 666 Identifier: ISSN: 0930-8989
CoNE: https://pure.mpg.de/cone/journals/resource/110978978742279