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  Laser intensity effects in carrier-envelope phase-tagged time of flight-photoemission electron microscopy

Chew, S. H., Gliserin, A., Schmidt, J., Bian, H., Nobis, S., Schertz, F., et al. (2016). Laser intensity effects in carrier-envelope phase-tagged time of flight-photoemission electron microscopy. Applied Physics B: Lasers and Optics, 122(4): 102. doi:10.1007/s00340-016-6374-3.

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 Creators:
Chew, Soo Hoon1, Author           
Gliserin, Alexander1, Author           
Schmidt, J.2, Author
Bian, H.2, Author
Nobis, S.2, Author
Schertz, F.2, Author
Kübel, Matthias3, Author           
Yang, Y. -Y.2, Author
Loitsch, B.2, Author
Stettner, T.2, Author
Finley, J. J.2, Author
Späth, C.2, Author
Ouacha, H.2, Author
Azzeer, A. M.2, Author
Kleineberg, U.2, Author
Affiliations:
1Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445564              
2external, ou_persistent22              
3Attosecond Imaging, Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445574              

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Language(s): eng - English
 Dates: 2016-08-172016-02-252016-04-122016
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
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Title: Applied Physics B: Lasers and Optics
  Other : Appl. Phys. B: Lasers O.
Source Genre: Journal
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Publ. Info: Heidelberg : Springer-Verlag
Pages: - Volume / Issue: 122 (4) Sequence Number: 102 Start / End Page: - Identifier: ISSN: 0946-2171
CoNE: https://pure.mpg.de/cone/journals/resource/954928582870