Laser intensity effects in carrier-envelope phase-tagged time of 
flight-photoemission electron microscopy

Chew, Soo Hoon; Gliserin, Alexander; Schmidt, J.; Bian, H.; Nobis, S.; Schertz, F.; Kübel, Matthias; Yang, Y. -Y.; Loitsch, B.; Stettner, T.; Finley, J. J.; Späth, C.; Ouacha, H.; Azzeer, A. M.; Kleineberg, U.

doi:10.1007/s00340-016-6374-3

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Laser intensity effects in carrier-envelope phase-tagged time of flight-photoemission electron microscopy

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Chew, Soo Hoon
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Gliserin, Alexander
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Kübel, Matthias
Attosecond Imaging, Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Chew, S. H., Gliserin, A., Schmidt, J., Bian, H., Nobis, S., Schertz, F., et al. (2016). Laser intensity effects in carrier-envelope phase-tagged time of flight-photoemission electron microscopy. Applied Physics B: Lasers and Optics, 122(4): 102. doi:10.1007/s00340-016-6374-3.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002B-13A1-D

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