Surface Layer Investigation Capability with EXLIE Cs-Deposition in NanoSIMS

Hoeschen, C.; Lugmeier, J.; Höschen, T.; Pohl, L.; Meisl, G.; Kögel-Knabner, I.

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Surface Layer Investigation Capability with EXLIE Cs-Deposition in NanoSIMS

Hoeschen, C., Lugmeier, J., Höschen, T., Pohl, L., Meisl, G., & Kögel-Knabner, I. (2016). Surface Layer Investigation Capability with EXLIE Cs-Deposition in NanoSIMS. Talk presented at SIMS Europe 2016. Münster. 2016-09-18 - 2016-09-20.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-5D9A-3 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-5D9B-1

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Creators:
Hoeschen, C.¹, Author
Lugmeier, J.¹, Author
Höschen, T.², Author
Pohl, L.¹, Author
Meisl, G.², Author
Kögel-Knabner, I.¹, Author

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1External Organizations, ou_persistent22
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327

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Language(s): eng - English

Dates: Submitted: 2016

Publication Status: Submitted

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Title: SIMS Europe 2016

Place of Event: Münster

Start-/End Date: 2016-09-18 - 2016-09-20

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