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  Dependence of grain sizes and microstrains on annealing temperature in Fe/Pt multilayers and L10 FePt thin films

Zotov, N., Feydt, J., & Ludwig, A. (2008). Dependence of grain sizes and microstrains on annealing temperature in Fe/Pt multilayers and L10 FePt thin films. Thin Solid Films, 517, 531-537. doi:http://dx.doi.org/10.1016/j.tsf.2008.06.062.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-A841-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-A842-E
Genre: Journal Article

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http://www.sciencedirect.com/science/article/pii/S0040609008007050 (Publisher version)
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 Creators:
Zotov, N., Author
Feydt, Jürgen1, Author           
Ludwig, A., Author
Affiliations:
1Electron Microscopy and Analytics, Center of Advanced European Studies and Research (caesar), Max Planck Society, ou_2173680              

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 Dates: 2008-01-01
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: http://dx.doi.org/10.1016/j.tsf.2008.06.062
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Title: Thin Solid Films
  Abbreviation : Thin Solid Films
Source Genre: Journal
 Creator(s):
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Publ. Info: Lausanne, Switzerland, etc. : Elsevier
Pages: - Volume / Issue: 517 Sequence Number: - Start / End Page: 531 - 537 Identifier: ISSN: 0040-6090
CoNE: https://pure.mpg.de/cone/journals/resource/954925449792