Correlative transmission EBSD-APT analysis of grain boundaries in CIGS and CZTS 
based thin-film solar cells

Schwarz, Torsten; Stechmann, Guillaume; Gault, Baptiste; Cojocaru-Mirédin, Oana; Choi, Pyuck-Pa; Redinger, Alex; Siebentritt, Susanne; Raabe, Dierk

Lokale TagsFreigabegeschichteDetailsÜbersicht

Correlative transmission EBSD-APT analysis of grain boundaries in CIGS and CZTS based thin-film solar cells

Schwarz, T., Stechmann, G., Gault, B., Cojocaru-Mirédin, O., Choi, P.-P., Redinger, A., et al. (2017). Correlative transmission EBSD-APT analysis of grain boundaries in CIGS and CZTS based thin-film solar cells. Talk presented at Euromat. Thessaloniki, Greece. 2017-09-17 - 2017-09-22.

Item is Freigegeben

einblenden: alle ausblenden: alle

Basisdaten

einblenden: ausblenden:

Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-94BF-2 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-94C0-B

Genre: Vortrag

ausblenden:

Urheber:
Schwarz, Torsten¹, Autor
Stechmann, Guillaume², Autor
Gault, Baptiste², Autor
Cojocaru-Mirédin, Oana^{2, 3}, Autor
Choi, Pyuck-Pa⁴, Autor
Redinger, Alex⁵, Autor
Siebentritt, Susanne⁵, Autor
Raabe, Dierk², Autor

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381
3RWTH Aachen, I. Physikalisches Institut IA, Aachen, Germany, ou_persistent22
4Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea, ou_persistent22
5University of Luxembourg, Laboratory for Photovoltaics, 41, rue du Brill, L-4422, Belvaux, Luxembourg, ou_persistent22