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Correlative transmission EBSD-APT analysis of grain boundaries in CIGS and CZTS based thin-film solar cells

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Schwarz,  Torsten
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stechmann,  Guillaume
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Gault,  Baptiste
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Cojocaru-Mirédin,  Oana
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
RWTH Aachen, I. Physikalisches Institut IA, Aachen, Germany;

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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Schwarz, T., Stechmann, G., Gault, B., Cojocaru-Mirédin, O., Choi, P.-P., Redinger, A., et al. (2017). Correlative transmission EBSD-APT analysis of grain boundaries in CIGS and CZTS based thin-film solar cells. Talk presented at Euromat. Thessaloniki, Greece. 2017-09-17 - 2017-09-22.


Cite as: https://hdl.handle.net/11858/00-001M-0000-002D-94BF-2
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